JPH0714880Y2 - 電極の汚れ診断機能付き残留塩素計 - Google Patents
電極の汚れ診断機能付き残留塩素計Info
- Publication number
- JPH0714880Y2 JPH0714880Y2 JP1988158605U JP15860588U JPH0714880Y2 JP H0714880 Y2 JPH0714880 Y2 JP H0714880Y2 JP 1988158605 U JP1988158605 U JP 1988158605U JP 15860588 U JP15860588 U JP 15860588U JP H0714880 Y2 JPH0714880 Y2 JP H0714880Y2
- Authority
- JP
- Japan
- Prior art keywords
- standard solution
- electrode
- measured
- switching valve
- generating means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000460 chlorine Substances 0.000 title claims description 25
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 title claims description 21
- 229910052801 chlorine Inorganic materials 0.000 title claims description 21
- 239000012086 standard solution Substances 0.000 claims description 28
- 238000005259 measurement Methods 0.000 claims description 26
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 claims description 24
- 239000007788 liquid Substances 0.000 claims description 14
- 239000011780 sodium chloride Substances 0.000 claims description 12
- 239000007864 aqueous solution Substances 0.000 claims description 9
- 238000004140 cleaning Methods 0.000 claims description 6
- 238000011109 contamination Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 4
- 238000005868 electrolysis reaction Methods 0.000 claims description 3
- 239000000243 solution Substances 0.000 claims description 3
- 238000003745 diagnosis Methods 0.000 claims 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 230000035945 sensitivity Effects 0.000 description 6
- 239000008213 purified water Substances 0.000 description 5
- 230000002159 abnormal effect Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 239000011324 bead Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000003756 stirring Methods 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Landscapes
- Hybrid Cells (AREA)
- Electrolytic Production Of Non-Metals, Compounds, Apparatuses Therefor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988158605U JPH0714880Y2 (ja) | 1988-12-06 | 1988-12-06 | 電極の汚れ診断機能付き残留塩素計 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988158605U JPH0714880Y2 (ja) | 1988-12-06 | 1988-12-06 | 電極の汚れ診断機能付き残留塩素計 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0295846U JPH0295846U (en]) | 1990-07-31 |
| JPH0714880Y2 true JPH0714880Y2 (ja) | 1995-04-10 |
Family
ID=31439083
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988158605U Expired - Lifetime JPH0714880Y2 (ja) | 1988-12-06 | 1988-12-06 | 電極の汚れ診断機能付き残留塩素計 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0714880Y2 (en]) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7214555B2 (en) | 1995-03-18 | 2007-05-08 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing display device |
| US8873011B2 (en) | 2000-03-16 | 2014-10-28 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and method of manufacturing the same |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2585972Y2 (ja) * | 1992-09-22 | 1998-11-25 | 電気化学計器株式会社 | 自動校正機能付き残留塩素計 |
| JP6372302B2 (ja) * | 2014-10-20 | 2018-08-15 | 東亜ディーケーケー株式会社 | 遊離残留塩素測定装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5458092U (en]) * | 1977-09-30 | 1979-04-21 | ||
| JPS6293760U (en]) * | 1985-12-04 | 1987-06-15 |
-
1988
- 1988-12-06 JP JP1988158605U patent/JPH0714880Y2/ja not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7214555B2 (en) | 1995-03-18 | 2007-05-08 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing display device |
| US7271858B2 (en) | 1995-03-18 | 2007-09-18 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing display-device |
| US7483091B1 (en) | 1995-03-18 | 2009-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor display devices |
| US8873011B2 (en) | 2000-03-16 | 2014-10-28 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and method of manufacturing the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0295846U (en]) | 1990-07-31 |
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